Developing an effective environmental life test plan is one of the challenges seen in new microelectronic product design. Some customers may not “require” environmental testing, but many customers will and may want to see the corresponding test data and results. Regardless of customer obligations, almost all new product designers have an internal minimum requirement for demonstrated environmental test endurance. Each of these environmental life test plans should be viewed with a “top down” approach. Looking at the top-most assembly level environmental endurance requirements first then flowing that requirement down to the lowest component level.
An environmental test strategy for new product development of microelectronic assemblies should be considered carefully. A well thought out test plan that includes a top-down approach, lead times and contingencies, measurable outputs, and a defined quantity of parts for analysis can be very cost effective. Integrating this test plan into a “test early, test often” strategy can further streamline early learning and ensure that objectives are met. New product development for microelectronic assemblies is very challenging and the proper strategy for environmental testing can get your product to market with the lowest overall development time and cost.
